Semiconductor Device Parameter Analyzer

Semiconductor Device Parameter Analyzer

The Keysight B1500A Semiconductor Device Parameter Analyzer Mainframe is used to characterize field effect transistors, electrochemical transistors, photovoltaics, and other electronic devices. The mainframe combines an integrated Windows operating system with 10 slot-configurable measurement units for rapid, low-noise characterization and data analysis. It is currently installed with two B1511B Source Measurement Units (SMU's) and a B1520A Capacitance Measurement Unit (CMU), allowing for multiple measurements without disconnecting the device. The SMU's range up to 100 V / 0.1 A with measurement resolution of 10 fA / 0.5 µV. The CMU covers a frequency range of 1 kHz to 5 MHz and will measure 1001 sweep points in CV, C-f, and C-t measurement modes.

For more information about these facilities, contact Sean Shaheen.

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